X-ray photoelectron spectroscopy (XPS) is a powerful technique widely used for the surface analysis of materials. At low energy resolution it provides qualitative and quantitative information on the ...

The PHI 5800 X-ray photoelectron spectrometer (XPS) is equipped with a dual source anode (Al and Mg), a hemispherical analyzer for XPS and Auger electron spectroscopy (AES) analysis, including ...