Nanowerk1 年
Ellipsometry for Nanotechnology: Measuring Thin Films
Compared to other thin film measurement techniques, ellipsometry offers superior sensitivity and non-destructive analysis. Its ability to measure the complex refractive index and thickness of thin ...
AZoNano4 年
SE-1000 - Cost-Effective Spectroscopic Ellipsometry for Thin Film Characterization
Let us help you with your inquiries, brochures and pricing requirements Request A Quote Download PDF Copy Request A Quote Download PDF Copy Request A Quote Download ...
AZOM5 年
Cost-Effective and Compact Spectroscopic Ellipsometry for Thin Film Characterization - SE-1000
Let us help you with your inquiries, brochures and pricing requirements Request A Quote Download PDF Copy Request A Quote Download PDF Copy Request A Quote Download ...
AZOM7 年
Spectroscopic Ellipsometer - FilmTek™ 2000SE
Based on a rotating compensator design, the FilmTek™ 2000SE spectroscopic ellipsometer combines spectroscopic ellipsometry with multiple angle reflectometry to make it ideally suited for measuring the ...