Ellipsometry is a non-destructive, optical measurement technique that characterizes the optical properties of thin films. It is highly sensitive to changes in the thickness and refractive index of the ...

The manual goniometer and the manual sample stage allow budget-conscious research and development labs to access cutting-edge rotating compensator ellipsometry. This flexible instrument can be ...

Spectroscopic ellipsometry is widely adopted in semiconductor processing, such as in the manufacturing of integrated circuits, flat display panels, and solar cells. However, a conventional ...

Based on a rotating compensator design, the FilmTek™ 2000SE spectroscopic ellipsometer combines spectroscopic ellipsometry with multiple angle reflectometry to make it ideally suited for measuring the ...

The manual goniometer and the manual sample stage allow budget-conscious research and development labs to access cutting-edge rotating compensator ellipsometry. This flexible instrument can be ...