Glovebox-assisted magnetic force microscope for studying air …
2024年1月10日 · Herein, we report on the construction and performance of a glovebox-assisted magnetic force microscope (MFM) operating in a cryogen-free magnet, realizing imaging of the intrinsic magnetic structure of water and oxygen-sensitive materials.
Magnetic force microscopy: High quality-factor two-pass mode
2024年11月12日 · Magnetic force microscopy (MFM) is a well-established technique in scanning probe microscopy that allows for the imaging of magnetic samples with a spatial resolution of tens of nm and stray fields down to the mT range. The spatial resolution and field sensitivity can be significantly improved by measuring in vacuum conditions.
Magnetic force microscopy of an operational spin nano …
2022年6月15日 · Here, we demonstrate a new method using MFM for probing the spatial profile of an operational nanoscale spintronic device, the spin Hall nano-oscillator (SHNO), which generates high-intensity spin...
“看见”磁畴：当前主流磁成像技术对比 - 知乎
目前，国仪量子已推出商用NV扫描探针显微镜—量子钻石原子力显微镜（Quantum diamond atomic force microscope, QDAFM），具有非侵入性、可覆盖宽温区、大磁场测量范围等独到优势。
We describe our cryogenic magnetic force microscope, operating between 4.2 and 300 K, in fields of 0–8 T. The system uses a fiber optic interferometer to measure cantilever deflections, permitting the tracking of the resonance frequency through the use of a phase locked loop.
Construction of a vector-field cryogenic magnetic force microscope ...
2022年6月29日 · In this study, we constructed a low-temperature MFM equipped with a 2–2–9-T vector magnet and a three-axis fiber-optic alignment system. The three-axis alignment device enables in situ calibration of the scanner at low temperatures as well as optimizes the intensity and sensitivity of the interferometer signal.
We present a fast, digital signal processor DSP -based feedback controller that allows active motion damping of low-k, high-Q cantilevers in magnetic resonance force microscopy. A setup using a piezoelement attached to the cantilever base for actuation and a beam deflection sensor for tip motion detection is employed for controller demonstration.
Magnetic force microscopy (MFM) enables mapping local magnetic fields across a sample surface with nanoscale resolution. To perform MFM, an atomic force microscopy (AFM) probe whose tip has been magnetized vertically (i.e., perpendicular to the probe cantilever) is oscillated at a fixed height above the sample surface. The
Magnetic Force Microscopy (MFM) - Bruker
Magnetic Force Microscopy (MFM) is a secondary imaging mode derived from TappingMode™ that maps the magnetic force gradient above the sample surface while simultaneously obtaining topographical data. MFM relies on a patented two-pass technique, LiftMode™.
Differential Magnetic Force Microscopy with a Switchable Tip
4 天之前 · The separation of physical forces acting on the tip of a magnetic force microscope (MFM) is essential for correct magnetic imaging. Electrostatic forces can be modulated by varying the tip-sample potential and minimized to map the local Kelvin potential. However, distinguishing magnetic forces from van der Waals forces typically requires two measurements with opposite tip magnetizations under ...
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